Magnetic depth profiling Co/Cu multilayers to investigate magnetoresistance (invited)

Journal of Applied Physics

Volumn 87, Issue 9 III, 2000, Pages 6639-6643

  Unguris, J ^a   Tulchinsky, D ^a   Kelley, M H ^a   Borchers, J A ^a   Dura, J A ^a   Majkrzak, C F ^a   Hsu, S Y ^b   Loloee, R ^b   Pratt Jr , W P ^b   Bass, J ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243098616     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372796     Document Type: Conference Paper

References (15)

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