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Journal of Materials Science

Volumn 45, Issue 7, 2010, Pages 1725-1733

Study on silicon carbide nanowires produced from carbon blacks and structure of carbon blacks

(3) Wieligor, M a Rich, R a Zerda, T W a

a TEXAS CHRISTIAN UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FTIR; GRAPHITIZATION PROCESS; GRAPHITIZED CARBON BLACK; HIGH CONCENTRATION; LATERAL SIZES; NARROW SIZE DISTRIBUTIONS; OUTER LAYER; SILICON CARBIDE NANOWIRES; TEM; UNIFORM DIAMETER;

AGGLOMERATION; AMORPHOUS CARBON; CRYSTALLITES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAPHITIZATION; NANOWIRES; RAMAN SPECTROSCOPY; SILICON CARBIDE; STACKING FAULTS;

CARBON BLACK;

EID: 76649093267 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-009-4133-0 Document Type: Article

Times cited : (8)

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