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Journal of Materials Science

Volumn 44, Issue 11, 2009, Pages 3010-3013

Bulk modulus of silicon carbide nanowires and nanosize grains

(6) Rich, Ryan M a Stelmakh, Svitlana a Patyk, Jaromir a Wieligor, Monika a Zerda, T W a Guo, Quanzhong b

a TEXAS CHRISTIAN UNIVERSITY (United States)

b BROOKHAVEN NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK MATERIALS; BULK MODULUS; DIAMOND ANVILS; ENERGY DISPERSIVE X-RAY ANALYSIS; GRAIN SIZES; NANO SIZES; NANO-SIZE GRAINS; PRESSURE MEDIUMS; SIC NANOWIRES; SILICON CARBIDE NANOWIRES; SILICON POWDERS; SMOOTH SURFACES; TEM; TEM IMAGES; X-RAY DIFFRACTION PATTERNS;

DIFFRACTION; ELASTIC MODULI; ELECTRIC WIRE; ETHANOL; HOLOGRAPHIC INTERFEROMETRY; METHANOL; NANOWIRES; SILICON CARBIDE; SINTERED CARBIDES; STACKING FAULTS;

CARBON NANOTUBES;

EID: 67349256719 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-009-3431-x Document Type: Article

Times cited : (10)

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