Feature based similarity search with application to speedpath analysis

Proceedings - International Test Conference

Volumn , Issue , 2009, Pages

  Callegari, Nicholas ^a   Wang, Li C ^a   Bastani, Pouria ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYSIS PROBLEMS; FEATURE-BASED; HIGH-PERFORMANCE MICROPROCESSORS; LARGE POPULATION; POTENTIAL METHODS; SILICON CHIP; SIMILARITY SEARCH;

EID: 76549128524     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2009.5355708     Document Type: Conference Paper

References (9)

1. K. Killpack, et al, "Analysis of Causation of Speed Failures in a Microprocessor: A Case Study," To appear in IEEE Design & Test Special Issue on Silicon Debug and Diagnosis 2008.
2. P. Bastani, N. Callegari, L. Wang, and M. Abadir. "Statistical diagnosis of unmodeled systematic timing effects," DAC, 2008.
3. P. Bastani, et al. "Speedpath prediction based on learning from a small set of examples," Proc. DAC, 2008.
4. D.Barton, P. Tangyunyong, J. Soden, A. Liang, and e. a. F. Low. "Infrared light emission from semiconductor devices," ISTFA Proc., 1996.
5. N. Callegari, P. Bastani, L. Wang, "Speedpath analysis based on hypothesis pruning and ranking," Submitted to DAC 2009.
6. Bernhard Schlkopf, and Alexander J. Smola. "Learning with Kernels: Support Vector Machines, Regularization, Optimization, and Beyond," The MIT Press, 2001.
7. K. S. Kim, S.Mitra, and P. G. Ryan, "Delay defect characteristics and testing strategies," IEEE D & T, 2003.
8. A. Gattiker and W. Maly, "Current Signatures," VLSI Test Symp., 1996.
9. P. Bastani, B. Lee, L.Wang, S. Sundareswaran, M. Abadir, "Analyzing the risk of timing modeling based on path delay tests," ITC 2007.