Measurement of high sensitivity and low crosstalk of zero-space microlens for 2.8- μm-pitch active pixel sensor

IEEE Transactions on Electron Devices

Volumn 57, Issue 2, 2010, Pages 415-421

  Jin, Xiangliang ^a,b,c   Fan, Xiaoping ^a   Liu, Zhibi ^a   Kuang, Zhangqu ^a   Cheng, Jie ^a   Chen, Jie ^d   Liu, Yu ^c   Yang, Jun ^c  

^a SuperPix Micro Technology Limited   (China)

^b XIANGTAN UNIVERSITY   (China)

^c UNIVERSITY OF WESTERN ONTARIO   (Canada)

^d INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Active pixel sensor; Crosstalk; Imager sensor; Microlens; Normal microlens; Sensitivity; Zero space microlens

Indexed keywords

ACTIVE PIXEL SENSOR; BLUE LIGHT; CMOS IMAGE SENSOR; CMOS PROCESSS; CMOS SENSORS; GREEN LIGHT; HIGH SENSITIVITY; IMAGE DEFINITION; IMAGE LUMINANCE; MICRO-LENS; NORMAL MICROLENS; PHOTODIODE ARRAYS; REAL IMAGES; RED LIGHT; SIMULATION RESULT; STATISTICAL DATAS; TERADYNE; TESTING RESULTS; WAFER TEST;

CMOS INTEGRATED CIRCUITS; CROSSTALK; DIGITAL CAMERAS; DIGITAL IMAGE STORAGE; IMAGE SENSORS; PIXELS; SENSITIVITY ANALYSIS; SILICON WAFERS; TECHNOLOGY;

MICROLENSES;

EID: 76349103037     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2009.2037177     Document Type: Article

References (5)

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