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Surface and Coatings Technology

Volumn 204, Issue 12-13, 2010, Pages 1933-1936

Nanostructural characterization of TiN-Cu films using EXAFS spectroscopy

(4) Pinakidou, F a Paloura, E C a Matenoglou, G M b Patsalas, P b

a ARISTOTLE UNIVERSITY OF THESSALONIKI (Greece)

b UNIVERSITY OF IOANNINA (Greece)

Author keywords

EXAFS; TiN coatings; TiN Cu nanocomposite films

Indexed keywords

BONDING ENVIRONMENT; CU FILMS; CU TARGET; ELEMENTAL TARGETS; EXAFS; EXAFS SPECTROSCOPY; GROWTH CONDITIONS; LOCAL COORDINATION; NANOCOMPOSITE FILM; NANOSTRUCTURAL; NEAREST NEIGHBORS; PARTIAL NITROGEN PRESSURE; SI(1 0 0); TIN COATING; TIN COATINGS;

ABSORPTION SPECTROSCOPY; COATINGS; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; LITHIUM COMPOUNDS; METALLIC FILMS; NANOCOMPOSITES; PULSED LASER DEPOSITION; PULSED LASERS; TARGETS; TITANIUM NITRIDE;

COPPER;

EID: 76349098903 PISSN: 02578972 EISSN: None Source Type: Journal
DOI: 10.1016/j.surfcoat.2009.10.053 Document Type: Article

Times cited : (17)

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