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Volumn 61, Issue 11, 2009, Pages 49-55

Critical assessment of the impurity diffusivities in solid and liquid silicon

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL ASSESSMENT; DENUDED ZONES; DIFFUSION OF IMPURITIES; DIFFUSION PHENOMENA; DIFFUSIVITIES; IMPURITY DIFFUSION; IMPURITY DIFFUSIVITY; INTRINSIC GETTERING; LEAST SQUARES ANALYSIS; LIQUID SILICON; PREEXPONENTIAL FACTOR; SEMI-EMPIRICAL CORRELATION; SILICON FEEDSTOCKS; THERMOCHEMICAL PROPERTIES;

EID: 76349093630     PISSN: 10474838     EISSN: 15431851     Source Type: Journal    
DOI: 10.1007/s11837-009-0167-7     Document Type: Article
Times cited : (60)

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    • (2000) ISIJ Int. , vol.40 , Issue.SUPPLEMENT
    • Mills, K.C.1    Courtney, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.