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Volumn 20, Issue 1, 2010, Pages 1-22

Statistical distribution of the field scattered by rough layered interfaces: Formulae derived from the small perturbation method

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE SCATTERING; ELECTROMAGNETIC WAVES;

EID: 76349089564     PISSN: 17455030     EISSN: 17455049     Source Type: Journal    
DOI: 10.1080/17455030903329374     Document Type: Article
Times cited : (10)

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