Electrochemical surface plasmon resonance: Basic formalism and experimental validation

Analytical Chemistry

Volumn 82, Issue 3, 2010, Pages 935-941

  Wang, Shaopeng ^a   Huang, Xinping ^a,b   Shan, Xiaonan ^a   Foley, Kyle J ^a   Tao, Nongjian ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b LANZHOU UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CONVENTIONAL CURRENTS; CONVOLUTION FUNCTIONS; ELECTROCHEMICAL CURRENTS; ELECTROCHEMICAL REACTIONS; ELECTROCHEMICAL SURFACE PLASMON RESONANCE; ELECTROCHEMICAL TECHNIQUES; EXPERIMENTAL VALIDATIONS; HETEROGENEOUS REACTIONS; MODEL SYSTEM; NUMERICAL INTEGRATIONS; NUMERICAL SIMULATION; REACTION MECHANISM; REACTION SPECIES; SPATIAL RESOLUTION; SPR SIGNALS; SURFACE BINDING; SURFACE SENSITIVITY;

CHLORINE COMPOUNDS; COMPUTER SIMULATION; CONVOLUTION; ELECTRIC CONDUCTIVITY MEASUREMENT; OPTICAL PROPERTIES; PLASMONS; SURFACE REACTIONS; VOLTAMMETRY;

SURFACE PLASMON RESONANCE;

RUTHENIUM DERIVATIVE; RUTHENIUM HEXAAMMINE;

ALGORITHM; ARTICLE; CHEMISTRY; ELECTROCHEMICAL ANALYSIS; METHODOLOGY; SURFACE PLASMON RESONANCE; VALIDATION STUDY;

ALGORITHMS; ELECTROCHEMICAL TECHNIQUES; RUTHENIUM COMPOUNDS; SURFACE PLASMON RESONANCE;

EID: 76149088097     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac902178f     Document Type: Article

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