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Volumn 80, Issue 13, 2008, Pages 5146-5151
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Surface impedance imaging technique
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Author keywords
[No Author keywords available]
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Indexed keywords
BINDING SITES;
CHARGE DENSITY;
DETECTORS;
ELECTRON GAS;
IMAGE ENHANCEMENT;
IMAGING TECHNIQUES;
MODULATION;
SENSORS;
SURFACE PLASMON RESONANCE;
SURFACE POTENTIAL;
(1 1 0) SURFACE;
AMERICAN CHEMICAL SOCIETY (ACS);
DC COMPONENTS;
EQUIVALENT CIRCUIT MODEL (ECM);
EXPERIMENTAL DATA;
FREE ELECTRON GAS;
IMAGE MEASURING;
INTERFACIAL IMPEDANCE;
LOCAL IMPEDANCE;
MOLECULAR BINDING;
POTENTIAL MODULATION;
SENSOR SURFACES;
SURFACE CHARGE DENSITIES;
SURFACE IMPEDANCES;
SURFACE PLASMON RESONANCE (SPR);
SURFACE PLASMON RESONANCE (SPR) IMAGING;
SURFACE CHARGE;
ANALYTIC METHOD;
ARTICLE;
DENSITY;
IMPEDANCE;
QUANTITATIVE ANALYSIS;
SENSOR;
SURFACE PLASMON RESONANCE;
ELECTRIC IMPEDANCE;
ELECTROCHEMISTRY;
IMAGE PROCESSING, COMPUTER-ASSISTED;
METALS;
SOLUTIONS;
SURFACE PLASMON RESONANCE;
SURFACE PROPERTIES;
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EID: 46849091552
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac800361p Document Type: Article |
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Times cited : (91)
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References (15)
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