On the formation of unusual diffusion profiles in CdxZn 1-xTe crystals after implantation of different elements

Defect and Diffusion Forum

Volumn 289-292, Issue , 2009, Pages 587-592

  Wolf, H ^a   Wagner, F ^a   Kronenberg, J ^a   Wichert, Th ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

Charged dopants; Stoichiometry; Uphill diffusion

Indexed keywords

CADMIUM; CADMIUM ALLOYS; DOPING (ADDITIVES); NICKEL; SEMICONDUCTOR ALLOYS; SILVER; STOICHIOMETRY; ZINC ALLOYS;

CONCENTRATION PROFILES; DIFFUSION BEHAVIOR; DIFFUSION PROFILES; DIFFUSION PROPERTIES; INTERSTITIAL POSITIONS; STRONG DEPENDENCES; TRANSITION ELEMENT; UP-HILL DIFFUSION;

DIFFUSION;

EID: 75949109890     PISSN: 10120386     EISSN: 16629507     Source Type: Journal    
DOI: 10.4028/www.scientific.net/DDF.289-292.587     Document Type: Conference Paper

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