Structure, linear and non-linear optical properties of thin As xSe1-x films

Journal of Optoelectronics and Advanced Materials

Volumn 11, Issue 12, 2009, Pages 2093-2101

  Petkov, K ^a   Todorov, R ^a   Tasseva, J ^a   Tsankov, D ^b  

^a CENTRAL LABORATORY OF PHOTOPROCESSES   (Bulgaria)

^b BULGARIAN ACADEMY OF SCIENCES   (Bulgaria)

Author keywords

Chalcogenide glasses; IR spectroscopy; Nonlinear refractive index; Optical properties; Thin films

Indexed keywords

AMORPHOUS SILICON; ENERGY GAP; FILM THICKNESS; INFRARED SPECTROSCOPY; OPTICAL BAND GAPS; OPTICAL CORRELATION; OPTICAL GLASS; OPTICAL PROPERTIES; PHOTOPOLYMERIZATION; PHOTORESISTS; REFRACTIVE INDEX; SELENIUM COMPOUNDS; SILICON WAFERS; STRUCTURAL PROPERTIES; SUBSTRATES; THERMAL EVAPORATION; THIN FILMS;

ABSORPTION CO-EFFICIENT; CHALCOGENIDE GLASS; EFFECTIVE COORDINATION NUMBERS; INORGANIC PHOTORESISTS; LINEAR OPTICAL PROPERTIES; MULTI-LAYERED STRUCTURE; NON-LINEAR OPTICAL PROPERTIES; NONLINEAR REFRACTIVE INDEX;

OPTICAL FILMS;

EID: 75949086796     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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