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Volumn 156-158, Issue , 2009, Pages 343-349

Hydrogenation in crystalline silicon materials for photovoltaic application

Author keywords

Bulk passivation; Defects; Gettering; Hydrogenation; Multicrystalline silicon; Ribbon silicon

Indexed keywords

ANNEALING; CHARGE CARRIERS; CHEMICAL VAPOR DEPOSITION; CRYSTALLINE MATERIALS; HYDROGEN; HYDROGENATION; INDUSTRIAL APPLICATIONS; PASSIVATION; POLYSILICON; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SILICON NITRIDE; SURFACE DEFECTS; COST REDUCTION; DEFECTS; PLASMA CVD; SEMICONDUCTOR DEVICES;

EID: 75849159892     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/SSP.156-158.343     Document Type: Conference Paper
Times cited : (21)

References (22)
  • 1
    • 84902929169 scopus 로고    scopus 로고
    • Photon 20094, p. 54
    • Photon 2009(4), p. 54
  • 4
    • 84902892882 scopus 로고    scopus 로고
    • A.G. Aberle: Advanced Surface Passivation and Analysis (Centre for Photovoltaic Engineering, UNSW, Australia 1999).
    • A.G. Aberle: Advanced Surface Passivation and Analysis (Centre for Photovoltaic Engineering, UNSW, Australia 1999).
  • 6
    • 84902946123 scopus 로고    scopus 로고
    • th EU PVSEC, Barcelona 2005, p. 717
    • th EU PVSEC, Barcelona 2005, p. 717
  • 10
    • 84902901160 scopus 로고    scopus 로고
    • th EU PVSEC, Glasgow 2000, p. 1120
    • th EU PVSEC, Glasgow 2000, p. 1120
  • 14
    • 84902893912 scopus 로고    scopus 로고
    • st EUPVSEC, Dresden 2006, p. 679
    • st EUPVSEC, Dresden 2006, p. 679
  • 22
    • 84902939442 scopus 로고    scopus 로고
    • rd EU PVSEC, Valencia 2008, p. 1863
    • rd EU PVSEC, Valencia 2008, p. 1863


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.