SCOPUS 정보 검색 플랫폼

Volumn 107, Issue 1, 2010, Pages

Chemical vapor deposition diamond based multilayered radiation detector: Physical analysis of detection properties

(12) Almaviva, S a Marinelli, Marco a Milani, E a Prestopino, G a Tucciarone, A a Verona, C a Verona Rinati, G a Angelone, M b Pillon, M b Dolbnya, I c Sawhney, K c Tartoni, N c

a UNIVERSITY OF ROME TOR VERGATA (Italy)

b ASSOCIAZIONE EURATOM ENEA SULLA FUSIONE (Italy)

c DIAMOND LIGHT SOURCE LTD (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN POTENTIAL; CHEMICAL VAPOR DEPOSITION DIAMOND; DETECTION CAPABILITY; DIAMOND LIGHT SOURCE; ELECTRICAL PROPERTY; EXPERIMENTAL DATA; EXPERIMENTAL SETUP; HIGH FLUX; HOMOEPITAXIAL; LAYERED STRUCTURES; METALLIC CONTACTS; MICROWAVE PLASMA CHEMICAL VAPOR DEPOSITIONS; MONTE CARLO SIMULATION; MULTI-LAYERED; PHYSICAL ANALYSIS; SCHOTTKY DIODES; SINGLE CRYSTAL DIAMOND; UNIVERSITY OF ROME; X RAY BEAM;

CHEMICAL DETECTION; CHEMICAL VAPOR DEPOSITION; COMPUTER SIMULATION; CRYSTAL STRUCTURE; DIAMONDS; ELECTRIC NETWORK ANALYSIS; LIGHT SOURCES; MICROWAVES; MONTE CARLO METHODS; PLASMA DEPOSITION; RADIATION DETECTORS; SCHOTTKY BARRIER DIODES; SINGLE CRYSTALS; THERMAL EVAPORATION; ULTRAVIOLET RADIATION; X RAYS;

ELECTRIC PROPERTIES;

EID: 75649129077 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3275501 Document Type: Article

Times cited : (82)

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