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Advanced Materials Research

Volumn 93-94, Issue , 2010, Pages 251-254

Effects of la-dopant on phase, microstructure and dielectric properties of Bi4Ti3O12 ceramics

(3) Siriprapa, Pasinee a Watcharapasorn, Anucha a Jiansirisomboon, Sukanda a

a CHIANG MAI UNIVERSITY (Thailand)

Author keywords

BLT; Dielectric properties; Layered compound; Microstructure; X ray diffraction

Indexed keywords

ALL-CERAMIC; CERAMIC GRAINS; DIELECTRIC CONSTANTS; GRAIN SIZE; LAYERED COMPOUND; PREFERRED ORIENTATIONS; SINTERING PROCEDURES; TEMPERATURE DEPENDENCE;

CALCINATION; CERAMIC MATERIALS; DIELECTRIC PROPERTIES; DIFFRACTION; LANTHANUM; MICROSTRUCTURE; SINTERING; SOLID STATE REACTIONS; X RAY DIFFRACTION;

X RAY DIFFRACTION ANALYSIS;

EID: 75649119660 PISSN: 10226680 EISSN: None Source Type: Book Series
DOI: 10.4028/www.scientific.net/AMR.93-94.251 Document Type: Conference Paper

Times cited : (1)

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