Using patent analyses to monitor the technological trends in an emerging field of technology: A case of carbon nanotube field emission display

Scientometrics

Volumn 82, Issue 1, 2010, Pages 5-19

  Chang, Pao Long ^a   Wu, Chao Chan ^b,c   Leu, Hoang Jyh ^a  

^a FENG CHIA UNIVERSITY   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^c Chungyu Institute of Technology   (Taiwan)

Author keywords

Carbon nanotube field emission display (CNT FED); Patent bibliometric analysis; Patent network analysis

Indexed keywords

EID: 75549092178     PISSN: 01389130     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11192-009-0033-y     Document Type: Article

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