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Volumn 58, Issue 2, 2009, Pages 275-279

Error-correcting codes for ternary content addressable memories

Author keywords

Codes; Correcting; ECCs; Error; LBCs; TCAMs

Indexed keywords

BIT-ERRORS; CODE-WORDS; CODES; CONTENT ADDRESSABLE MEMORIES; CORRECT ERROR; DATA BITS; ERROR CORRECTING CODE; ERROR MITIGATION; ERROR-RESILIENT; LINEAR BLOCK CODE; MATCH LINE; MEMORY DENSITY; RANDOM ACCESS MEMORIES; SENSE AMPLIFIER; SILICON TECHNOLOGIES; SIMPLE MAJORITY; SOFT ERROR; SOFT-ERROR TOLERANCE; TERNARY CAM; TERNARY CONTENT ADDRESSABLE MEMORIES;

EID: 75449119471     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2008.179     Document Type: Article
Times cited : (28)

References (5)
  • 5
    • 33644661238 scopus 로고    scopus 로고
    • Content-addressable memory (CAM) circuits and architectures: A tutorial and survey
    • Mar.
    • K. Pagiamtzis and A. Sheikholeslami, "Content-Addressable Memory (CAM) Circuits and Architectures: A Tutorial and Survey," IEEE J. Solid- State Circuits, vol.41, no.3, pp. 712-727, http://pagiamtzis.com/cam/ camintro.html, Mar. 2006.
    • (2006) IEEE J. Solid-State Circuits , vol.41 , Issue.3 , pp. 712-727
    • Pagiamtzis, K.1    Sheikholeslami, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.