메뉴 건너뛰기




Volumn 368, Issue 1 PART 2, 2008, Pages 72-77

Current transients to detect polarization reversal of ferroelectric nanoislands by conducting AFM

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED FIELD; COERCIVE FIELD; CONDUCTING AFM; CURRENT TRANSIENTS; FERROELECTRIC MEMORY DEVICES; MEMORY DEVICE; MODEL SYSTEM; NANO-ISLANDS; NEW CONCEPT; PIEZOELECTRIC RESPONSE; POLARIZATION REVERSALS;

EID: 75449104311     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190802367968     Document Type: Conference Paper
Times cited : (2)

References (7)
  • 1
    • 33746591766 scopus 로고    scopus 로고
    • Nanoscale ferroelectrics: Processing, characterization and future trends
    • 2443-2459
    • A. Gruverman and A. Kholkin, Nanoscale ferroelectrics: processing, characterization and future trends. Reports on Progress in Physics 69, 2443-2459 (2006).
    • (2006) Reports on Progress in Physics , vol.69
    • Gruverman, A.1    Kholkin, A.2
  • 3
    • 34447337280 scopus 로고    scopus 로고
    • Nanoscale Ferroelectric Information Storage Based on Scanning Nonlinear Dielectric Microcsopy
    • Y. Cho, Nanoscale Ferroelectric Information Storage Based on Scanning Nonlinear Dielectric Microcsopy, J. Nanoscience and Nanotechnology 7, 105-116 (2007).
    • (2007) J. Nanoscience and Nanotechnology , vol.7 , pp. 105-116
    • Cho, Y.1
  • 4
    • 1542336939 scopus 로고    scopus 로고
    • Three-dimensional high-resolution reconstruction o polarization in ferroelectric capacitors by piezoresponse force microscopy
    • B. J. Rodriguez, A. Gruverman, A. I. Kingon, R. J. Nemanich, and J. S. Cross, Three-dimensional high-resolution reconstruction o polarization in ferroelectric capacitors by piezoresponse force microscopy. J. Applied Physics 95, 1958-1962 (2004).
    • (2004) J. Applied Physics , vol.95 , pp. 1958-1962
    • Rodriguez, B.J.1    Gruverman, A.2    Kingon, A.I.3    Nemanich, R.J.4    Cross, J.S.5
  • 6
    • 33646712594 scopus 로고    scopus 로고
    • Simultaneous measurement of the piezoelectric and dielectric response of nanoscale ferroelectric capacitors by an atomic force microscopy based approach
    • A. Petraru, V. Nagarajan, H. Kohlstedt, R. Ramesh, D. G. Shlom, and R. Waser, Simultaneous measurement of the piezoelectric and dielectric response of nanoscale ferroelectric capacitors by an atomic force microscopy based approach. Appl. Phys. A. 84, 67-71 (2006).
    • (2006) Appl. Phys. A , vol.84 , pp. 67-71
    • Petraru, A.1    Nagarajan, V.2    Kohlstedt, H.3    Ramesh, R.4    Shlom, D.G.5    Waser, R.6
  • 7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.