Ferroelectric/antiferroelectric Pb(Zr0.8Ti0.2)O 3/PbZrO3 epitaxial multilayers: Growth and thickness-dependent properties

Ferroelectrics

Volumn 370, Issue 1 PART 4, 2008, Pages 140-146

  Boldyreva, Ksenia ^a   Pintilie, Lucian ^a,b   Lotnyk, Andriy ^a   Misirlioglu, I B ^a   Alexe, Marin ^a   Hesse, Dietrich ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

Epitaxial multilayers; Ferroelectric antiferroelectric; Lead zirconate; Lead zirconate titanate

Indexed keywords

ANTIFERROELECTRICS; BOTTOM ELECTRODES; CAPACITANCE-VOLTAGE CURVE; EPITAXIAL MULTILAYERS; FERROELECTRIC BEHAVIOR; FERROELECTRIC STATE; LAYER THICKNESS; LEAD ZIRCONATE; LEAD ZIRCONATE TITANATE; SRTIO; STRAIN EFFECT; SWITCHING CURRENTS;

ANTIFERROELECTRICITY; FERROELECTRICITY; LEAD; PULSED LASER DEPOSITION; PULSED LASERS; SEMICONDUCTING LEAD COMPOUNDS; ZIRCONIUM;

MULTILAYERS;

EID: 75449092650     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190802384492     Document Type: Conference Paper

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