Dielectric properties of PbZrxTi1-xO3/PbZrO3 multilayer thin films

Materials Research Bulletin

Volumn 36, Issue 11, 2001, Pages 1931-1937

  Bae, Se Hwan ^a   Jeon, Kie Beom ^a   Jin, Byung Moon ^b  

^a Dong A University   (South Korea)

^b Dong Eui University   (South Korea)

Author keywords

A. thin films; B. sol gel chemistry; C. X ray diffraction; D. crystal structure

Indexed keywords

ANNEALING; ANTIFERROELECTRICITY; CRYSTAL STRUCTURE; LEAD COMPOUNDS; PERMITTIVITY; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; SOL-GELS; X RAY DIFFRACTION ANALYSIS;

ANTIFERROELECTRIC PROPERTIES;

THIN FILMS;

EID: 0035885434     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(01)00699-7     Document Type: Article

References (9)