Effects of primary aberrations on the fluorescence depletion patterns of STED microscopy

Optics Express

Volumn 18, Issue 2, 2010, Pages 1657-1666

  Deng, Suhui ^a,b   Liu, Li ^a   Cheng, Ya ^a   Li, Ruxin ^a   Xu, Zhizhan ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; GAUSSIAN BEAMS; STIMULATED EMISSION;

FLUORESCENCE-DEPLETION; HOLE SIZE; PEAK INTENSITY; PHASE PLATE; PRIMARY ABERRATION; SPHERICAL ABERRATIONS;

ABERRATIONS;

ALGORITHM; ARTICLE; ARTIFACT; COMPUTER ASSISTED DIAGNOSIS; EQUIPMENT; FLUORESCENCE MICROSCOPY; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

ALGORITHMS; ARTIFACTS; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY, FLUORESCENCE; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 75249094185     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.001657     Document Type: Article

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