Ag related defect state in ZnO thin films

AIP Conference Proceedings

Volumn 1199, Issue , 2009, Pages 122-123

  Von Wenckstern, Holger ^a   Lajn, Alexander ^a   Laufer, Andreas ^b   Meyer, Bruno K ^b   Hochmuth, Holger ^a   Lorenz, Michael ^a   Grundmann, Marius ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b JUSTUS LIEBIG UNIVERSITY   (Germany)

Author keywords

Admittance; Ag diffusion; DLTS; Pulsed laser deposition; Schottky contact; Secondary ion mass spectroscopy; ZnO

Indexed keywords

EID: 74849124119     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3295327     Document Type: Conference Paper

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