Characterization of detector-grade CdZnTe crystals grown by traveling heater method (THM)

Journal of Crystal Growth

Volumn 312, Issue 4, 2010, Pages 507-513

  Awadalla, S A ^a   Mackenzie, J ^a   Chen, H ^a   Redden, B ^a   Bindley, G ^a   Duff, M C ^b   Burger, A ^c   Groza, M ^c   Buliga, V ^c   Bradley, J P ^d   Dai, Z R ^d   Teslich, N ^d   Black, D R ^e  

^a REDLEN TECHNOLOGIES   (Canada)

^b SAVANNAH RIVER NATIONAL LABORATORY   (United States)

^c FISK UNIVERSITY   (United States)

^d LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^e NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

A1. CZT; A2. Secondary phases; A2. THM; A3. Surface treatment

Indexed keywords

A1. CZT; AVERAGE ENERGY; CDZNTE CRYSTALS; CDZNTE DETECTORS; COMPTON; LOW DENSITY; SECONDARY PHASIS; STRUCTURAL FEATURE; SUBMICRON; TRAVELING HEATER METHOD; WORK FOCUS;

CADMIUM ALLOYS; CADMIUM COMPOUNDS; CESIUM; CRYSTALS; RADIATION DETECTORS; TELLURIUM COMPOUNDS; Z TRANSFORMS;

SURFACE TREATMENT;

EID: 74549201679     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2009.11.007     Document Type: Article

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