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Volumn 1202, Issue , 2009, Pages 102-105

X-ray diffraction microstructural analysis of bimodal-size-distribution MgO nanopowders

Author keywords

Bimodal size distribution; MgO; Nanopowder; X ray diffraction

Indexed keywords


EID: 74549161745     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3295577     Document Type: Conference Paper
Times cited : (4)

References (8)
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  • 2
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    • Effect of a crystallite size distribution on x-ray diffraction line profiles and whole-powder-pattern fitting
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    • (2000) Journal Applied Crystallography , vol.33 , pp. 964-974
    • Langford, J.I.1    Louër, D.2    Scardi, P.3
  • 3
    • 0002029775 scopus 로고    scopus 로고
    • Voigt function model in diffraction-line broadening analysis
    • R. Snyder, J. Fiala, and H.J. Bunge, Editors, IUCr/Oxford University Press: Oxford. p
    • Balzar, D., Voigt function model in diffraction-line broadening analysis, in Defect and Microstructure Analysis by Diffraction, R. Snyder, J. Fiala, and H.J. Bunge, Editors. 1999, IUCr/Oxford University Press: Oxford. p. 94-126.
    • (1999) Defect and Microstructure Analysis by Diffraction , pp. 94-126
    • Balzar, D.1
  • 4
    • 0036098960 scopus 로고    scopus 로고
    • Whole powder pattern modelling
    • Scardi, P. and M. Leoni, Whole powder pattern modelling. Acta Crystallographica, 2001. A58: p. 190-200.
    • (2001) Acta Crystallographica , vol.A58 , pp. 190-200
    • Scardi, P.1    Leoni, M.2
  • 5
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    • Bimodal distributions of profile-broadening effects in Rietveld refinement
    • Young, R.A. and A. Sakhtivel, Bimodal distributions of profile-broadening effects in Rietveld refinement. Journal of Applied Crystallography, 1988. 21: p. 416-425.
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    • Young, R.A.1    Sakhtivel, A.2
  • 7
    • 33748356589 scopus 로고    scopus 로고
    • Development of MgO ceramics standards for x-ray and neutron line broadening assessments
    • Pratapa, S. and B.H. O'Connor, Development of MgO ceramics standards for x-ray and neutron line broadening assessments. Advances in X-ray Analysis, 2002. 45: p. 41-47.
    • (2002) Advances in X-ray Analysis , vol.45 , pp. 41-47
    • Pratapa, S.1    O'Connor, B.H.2
  • 8
    • 0347227352 scopus 로고    scopus 로고
    • Standard Reference Material 660a. Lanthanum Hexaboride Powder - Line Position and Line Shape Standard for Powder Diffraction
    • Gaithersburg, MD. USA
    • Freiman, S.W. and N.M. Trahey, Standard Reference Material 660a. Lanthanum Hexaboride Powder - Line Position and Line Shape Standard for Powder Diffraction. 2000, National Institute of Standards & Technology (NIST): Gaithersburg, MD. USA
    • (2000) National Institute of Standards & Technology (NIST)
    • Freiman, S.W.1    Trahey, N.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.