Diagnose effective evolutionary prototype selection using an overlapping measure

International Journal of Pattern Recognition and Artificial Intelligence

Volumn 23, Issue 8, 2009, Pages 1527-1548

  García, Salvador ^a   Cano, José Ramón ^b   BernadÓ Mansilla, Ester ^c   Herrera, Francisco ^a  

^a UNIVERSITY OF GRANADA   (Spain)

^b UNIVERSITY OF JAÉN   (Spain)

^c UNIVERSITAT RAMON LLULL   (Spain)

Author keywords

Complexity measures; Data complexity; Evolutionary prototype selection; Overlapping measure; Prototype selection

Indexed keywords

SOFTWARE ENGINEERING;

COMPLEXITY MEASURES; COMPUTATIONAL COSTS; DATA COMPLEXITY; K-VALUES; NEAREST-NEIGHBOUR CLASSIFIER; OVERLAPPING MEASURE; PROTOTYPE SELECTION;

PATTERN RECOGNITION;

EID: 74549133500     PISSN: 02180014     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218001409007727     Document Type: Article

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