Complexity measures of supervised classification problems

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 24, Issue 3, 2002, Pages 289-300

  Ho, Tin Kam ^a,b   Basu, Mitra ^a,c  

^a IEEE   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c City University of New York   (United States)

Author keywords

Classification; Clustering; Complexity; Linear separability; Mixture identifiability

Indexed keywords

CLUSTERING; FEATURE VECTOR; LINEAR SEPARABILITY; MIXTURE IDENTIFIABILITY;

ALGORITHMS; CALCULATIONS; COMPUTATIONAL COMPLEXITY; DATA STRUCTURES; INTERPOLATION; LINEAR PROGRAMMING; PRINCIPAL COMPONENT ANALYSIS; RANDOM PROCESSES; TOPOLOGY;

FEATURE EXTRACTION;

EID: 0036522441     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.990132     Document Type: Article

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