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Volumn 39, Issue 1, 2010, Pages 132-137

Growth of epitaxial (110) 0.7Pb(Mg 1/3Nb 2/3)O 3-0.3PbTiO 3 thin films on r-plane sapphire substrates by rf magnetron sputtering

(3) Krishna, Lakshmi a Sunder, Madhana a Moran, P D a

a Michigan Technological University (United States)

Author keywords

Heteroepitaxy; High resolution x ray diffraction; PMN PT; R plane sapphire; RF magnetron sputtering

Indexed keywords

CRYSTALLINITIES; ELEVATED TEMPERATURE; GROWTH TEMPLATE; HETEROEPITAXY; HIGH RESOLUTION X RAY DIFFRACTION; PLANE SAPPHIRE; PMN-PT FILM; RF-MAGNETRON SPUTTERING; SEED LAYER; SUBSTRATE SURFACE; SUBSTRATE TEMPERATURE;

AMORPHOUS FILMS; CRYSTAL STRUCTURE; DIFFRACTION; EPITAXIAL FILMS; EPITAXIAL GROWTH; LEAD; MAGNETRON SPUTTERING; MAGNETRONS; OXIDE MINERALS; PEROVSKITE; PHOTOTRANSISTORS; RAPID THERMAL ANNEALING; RAPID THERMAL PROCESSING; SAPPHIRE; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SUBSTRATES;

EID: 74449085451 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-009-0945-6 Document Type: Article

Times cited : (5)

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