Fabrication and optical properties of Pb(Mg1/3Nb 2/3)O3-PbTiO3 thin films on Si substrates using the PLD method

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 55, Issue 5, 2008, Pages 1023-1028

  Shinozaki, Kazuo ^a   Hayashi, Shogo ^a   Wakiya, Naoki ^b   Kiguchi, Takanori ^a   Tanaka, Junzo ^a   Ishizawa, Nobuo ^c   Sato, Keisuke ^d   Kondo, Masao ^d   Kurihara, Kazuaki ^d  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b SHIZUOKA UNIVERSITY   (Japan)

^c NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^d FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; FULL WIDTH AT HALF MAXIMUM; LEAD COMPOUNDS; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; REFRACTIVE INDEX;

ELECTRO-OPTIC COEFFICIENT; ELECTRO-OPTIC PROPERTIES; TRANSVERSE ELECTRIC FIELD (TE);

EPITAXIAL FILMS;

SILICON;

ARTICLE; ARTIFICIAL MEMBRANE; CERAMICS; CHEMISTRY; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; MATERIALS TESTING; METHODOLOGY; OPTICS;

CERAMICS; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; OPTICS; SILICON;

EID: 44249110733     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2008.749     Document Type: Conference Paper

References (7)

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6. S. Hayashi, N. Wakiya, T. Kiguchi, J. Tanaka, and K. Shinozaki, "Fabrication and microstructural change of PMN-PT thin films on Si substrates by PLD with mask and double-pulse laser excitation," Key Eng. Mater., vol. 350, pp. 111-114, 2007.
7. V. Pavlenko, A. Akimov, S. Kurilkina, I. Utkin, and H.-Y. Lee, "Characterization of new electrooptical PMN-PT single crystal," in Optical Design and Engineering II, Proc. SPIE, vol. 5962, art. no. 59622X, 2005.