A study on the digital nano-moiré method and its phase shifting technique

Measurement Science and Technology

Volumn 15, Issue 9, 2004, Pages 1716-1721

  Xie, Huimin ^a   Liu, Zhanwei ^a   Fang, Daining ^a   Dai, Fulong ^a   Gao, Hongjun ^b   Zhao, Yapu ^c  

^a TSINGHUA UNIVERSITY   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^c INSTITUTE OF MECHANICS   (China)

Author keywords

Crystal lattice; Digital grating; Nano moir method; Phase shifting technique

Indexed keywords

COMPUTER SOFTWARE; CRYSTAL LATTICES; DEFORMATION; GRAPHITE; PYROLYSIS;

DIGITAL REFERENCE GRATING (DRG); FEASIBILITY; HIGHLY ORIENTED PYROLYTIC GRAPHITE (HOPG); NANOSCOPIC DEFORMATION;

PHASE SHIFT;

MEASUREMENT METHOD;

EID: 7444243807     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/15/9/007     Document Type: Article

References (22)

1. Weller R and Shepard B M 1948 Displacement measurement by mechanical interferometry Proc. Soc. for Exp. Stress Anal. 6 35-8
2. Morse S A, Durelli J and Sciammarella C A 1960 Geometry of moiré fringes in strain analysis J. Eng. Mech. Div., ASCE 86 105-26
3. Sciammarela C A and Durelli A J 1961 Moiré fringes as a means of analyzing strains J. Eng. Mech. Div., ASCE 87 55-74
4. Durelli A J and Parks V J 1970 Moiré Analysis of Strain (Englewood Cliffs, NJ: Prentice Hall)
5. Theocaris S 1969 Moiré Fringe in Strain Analysis (Oxford: Pergamon)
6. Post D, Han B and Ifju P 1994 High Sensitivity Moiré (Berlin: Springer)
7. Chiang F P 1982 Moiré method of strain analysis Manual on Experimental Stress Analysis 5th edn, ed J F Doyle and J W Phillips (Bethel, CT: Society for Experimental Mechanics) pp 107-35
8. Post D 1988 Sharping and multiplication of moiré fringe Exp. Mech. 28 329-35
9. Dally J W and Read D T 1993 Electron-beam moiré Exp. Mech. 33 270-7
10. Kishimoto E M and Shinya N 1993 Micro-creep deformation measurement by a moiré method using electron beam lithography and electron beam scan Opt. Eng. 32 522-6
11. Read D T, Dally J W and Szanto M 1993 Scanning moiré at high magnification using optical methods Exp. Mech. 33 110-6
12. Asundi A and Yung K H 1991 Logical moiré and applications Exp. Mech. 31 236-42
13. Asundi A and Yung K H 1991 Phase shifting and logical moiré J. Opt. Soc. Am. A 18 1591-600
14. Asundi A and Wong C M 1991 Shadow moiré using LCD projection panel Exp. Tech. 15 44-8
15. Kato J, Yamaguhci I, Nakamura T and Kuwashima S 1997 Video-rate fringe analyzer based on phase shifting electronic moiré patterns Appl. Opt. 36 8403-12
16. Womack K H 1984 Interferometric phase measurement using spatial synchronous detection Opt. Eng. 23 391-5
17. Xie H M, Dai F L, Yang H, Liu N, Dietz P and Schmidt A 1998 The residual deformation measurement of nanometer crack in Si(111)7 × 7 with the scanning tunneling microscope Scanning Probe Microsc. 1 181-5
18. Chen C J 1993 Introduction to Scanning Tunnel Microscope (New York: Oxford University Press)
19. Hashimoto H and Ueda R 1957 Detection of dislocation by the moiré pattern in electron micrographs Acta Cryst. 10 143
20. Pashley D W 1957 Observation of dislocation in metals by means of moiré pattern on electron micrographs Nature 179 752-5
21. Dai F L and Xing Y M 1999 Nano-moiré method Acta Mech. Sin. 15 283-8
22. Xie H M, Kishimoto S, Asundi A, Chai G B and Norio S Y 2000 In-plane deformation measurement using the atomic force microscope moiré method Nanotechnology 11 24-9