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Volumn 15, Issue 3, 1999, Pages 283-288
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Nano-moire method
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Author keywords
Crystal lattice; Moir ; Nano deformation experiment; Nano moir
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Indexed keywords
DISLOCATIONS (CRYSTALS);
LIGHT INTERFERENCE;
MECHANICAL VARIABLES MEASUREMENT;
MOIRE FRINGES;
NANOTECHNOLOGY;
OPTICAL INSTRUMENTS;
ATOM SIZE SENSITIVITY;
ATOM SIZE SPATIAL RESOLUTION;
DISLOCATION DISTRIBUTION MEASUREMENT;
DISPLACEMENT MEASUREMENT;
NANO MOIRE;
NANOMECHANICS;
STRAIN MEASUREMENT;
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EID: 0033171137
PISSN: 05677718
EISSN: None
Source Type: Journal
DOI: 10.1007/bf02486156 Document Type: Article |
Times cited : (28)
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References (7)
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