Characterizing and modeling the noise and complex impedance of feedhorn-coupled TES polarimeters

AIP Conference Proceedings

Volumn 1185, Issue , 2009, Pages 211-214

  Appel, J W ^a   Austermann, J E ^b   Beall, J A ^c   Becker, D ^c   Benson, B A ^d   Bleem, L E ^d   Britton, J ^c   Chang, C L ^d   Carlstrom, J E ^d   Cho, H M ^c   Crites, A T ^d   Essinger Hileman, T ^a   Everett, W ^d   Halverson, N W ^b   Henning, J W ^b   Hilton, G C ^c   Irwin, K D ^c   McMahon, J ^d   Mehl, J ^d   Meyer, S S ^d   Niemack, M D ^c   Parker, L P ^a   Simont, S M ^b   Staggs, S T ^a   Visnjic, C ^a   Yoon, K W ^c   Zhao, Y ^a   more..

^a PRINCETON UNIVERSITY   (United States)

^b UNIVERSITY OF COLORADO   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d UNIVERSITY OF CHICAGO   (United States)

Author keywords

Cmb; Polarimeter; TES

Indexed keywords

EID: 74349106718     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3292317     Document Type: Conference Paper

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