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Volumn 490, Issue 1-2, 2010, Pages

Mechanical and dielectric properties of porous Si3N4-SiC(BN) ceramic

Author keywords

Dielectric properties; Mechanical properties; Silicon carbide; Silicon nitride; X ray diffraction

Indexed keywords

ANNEALING TEMPERATURES; IMAGINARY PARTS; MECHANICAL AND DIELECTRIC PROPERTIES; NANO-SIZED; POROUS SI; PRECURSOR INFILTRATION PYROLYSIS; REAL PART;

EID: 74149092503     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.10.107     Document Type: Letter
Times cited : (65)

References (34)
  • 11
    • 0042010503 scopus 로고
    • Beatty R.L., Sutton W.H., and Iskander M.F. (Eds). April 27 to May 1, 1992, Material Research Society, Pittsburgh, Pennsylvania, Materials Research Society Symposium Proceedings
    • Patterson M.C.L., Apte P.S., Kimber R.M., and Roy R. In: Beatty R.L., Sutton W.H., and Iskander M.F. (Eds). Microwave Processing of Materials III. Proc. Symp. San Francisco, vol. 269. April 27 to May 1, 1992 (1992), Material Research Society, Pittsburgh, Pennsylvania, Materials Research Society Symposium Proceedings 301
    • (1992) Microwave Processing of Materials III. Proc. Symp. San Francisco, vol. 269 , pp. 301
    • Patterson, M.C.L.1    Apte, P.S.2    Kimber, R.M.3    Roy, R.4
  • 28
    • 71749090212 scopus 로고    scopus 로고
    • X.W. Yin, X.M. Li, L.T. Zhang, L.F. Cheng, Y.S. Liu, T.H. Pan, Int. Appl. Ceram. Technol., doi:10.1111/j.1744-7402.2008.02347.x.
    • X.W. Yin, X.M. Li, L.T. Zhang, L.F. Cheng, Y.S. Liu, T.H. Pan, Int. Appl. Ceram. Technol., doi:10.1111/j.1744-7402.2008.02347.x.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.