Conduction and dielectric behaviour of SiC nano-sized materials

Solid State Communications

Volumn 115, Issue 7, 2000, Pages 389-393

  Kassiba, A ^a   Tabellout, M ^a   Charpentier, S ^a   Herlin, N ^b   Emery, J R ^a  

^a Lab Phys l'Etat Condense U   (France)

^b CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC RELAXATION; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; INTERFACES (MATERIALS); MORPHOLOGY; NANOSTRUCTURED MATERIALS; POLARIZATION; SPECTROSCOPIC ANALYSIS;

DIELECTRIC RESPONSE;

SILICON CARBIDE;

EID: 0033688604     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(00)00195-2     Document Type: Article

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