Controlled deposition of highly ordered soluble acene thin films: Effect of morphology and crystal orientation on transistor performance

Advanced Materials

Volumn 21, Issue 48, 2009, Pages 4926-4931

  Sele, Christoph W ^b   Charlotte Kjellander, B K ^a   Niesen, Bjoern ^b   Thornton, Martin J ^a   Van Der Putten, J Bas P H ^a   Myny, Kris ^c   Wondergem, Harry J ^d   Moser, Armin ^e   Resel, Roland ^e   Van Breemen, Albert J J M ^a   Van Aerle, Nick ^b   Heremans, Paul ^c   Anthony, John E ^f   Gelinck, Gerwin H ^a  

^a HOLST CENTRE   (Netherlands)

^b Polymer Vision   (Netherlands)

^c IMEC   (Belgium)

^d PHILIPS RESEARCH LABORATORIES   (Netherlands)

^e GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^f UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALIGNED FILMS; CONTROLLED DEPOSITION; DIP-COATING PROCESS; DRYING VELOCITIES; ELECTRICAL TRANSISTOR; ELECTRONIC DEVICE; FILM DRYING; NEEDLE-LIKE CRYSTALS; SMALL-MOLECULE ORGANIC SEMICONDUCTOR; STRUCTURAL CHARACTERIZATION; TRANSISTOR PERFORMANCE;

COATINGS; DEPOSITION; DEWATERING; MORPHOLOGY; TRANSISTORS;

CRYSTAL ORIENTATION;

EID: 73949140677     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200901548     Document Type: Article

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