Super-resolution and reconstruction of sparse sub-wavelength images

Optics Express

Volumn 17, Issue 26, 2009, Pages 23920-23946

  Gazit, Snir ^a   Szameit, Alexander ^a   Eldar, Yonina C ^a   Segev, Mordechai ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

GEOMETRICAL OPTICS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; OPTOELECTRONIC DEVICES; SENSORS;

ATOMIC FORCE MICROSCOPES; COMPRESSED SENSING; EVANESCENT WAVE; FAR-FIELD; IMAGE RECOVERY; OPTICAL IMAGE; PROOF OF PRINCIPLES; RECONSTRUCTION METHOD; SCANNING TUNNELING MICROSCOPES; SPATIAL FILTERS; SPATIAL RESOLUTION; SUB-WAVELENGTH; SUPER RESOLUTION;

MILITARY PHOTOGRAPHY;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; METHODOLOGY; MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 73949092310     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.023920     Document Type: Article

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