Chemistry and electronic properties of ferromagnetic metal-organic semiconductor interfaces: Fe on CuPc

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 12, 2009, Pages 2763-2770

  Aristov, V Yu ^a   Molodtsova, O V ^b   Ossipyan, Yu A ^c   Doyle, B P ^d   Nannarone, S ^a   Knupfer, M ^e  

^a IFW DRESDEN   (Germany)

^b INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

^c LABORATORIO TASC   (Italy)

^d UNIVERSITY OF JOHANNESBURG   (South Africa)

^e UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL INTERACTIONS; COPPER ATOMS; COPPER PHTHALOCYANINE; CORE LEVELS; CU ATOMS; DEPOSITED METAL; FE ATOMS; FERROMAGNETIC METAL; HIGH-RESOLUTION PHOTOEMISSION; INTERFACE LAYER; METAL DEPOSITION; MOLECULAR THIN FILM; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURES; ORGANIC FILMS; ORGANIC MOLECULES; ORGANIC SEMICONDUCTOR; SPIN-POLARIZED CARRIERS;

ABSORPTION SPECTROSCOPY; ATOMS; CARBON FILMS; DEPOSITION; ELECTRON SPECTROSCOPY; ELECTRONIC PROPERTIES; EMISSION SPECTROSCOPY; FERROMAGNETIC MATERIALS; FERROMAGNETISM; METALS; SEMICONDUCTING ORGANIC COMPOUNDS; SYNCHROTRON RADIATION;

ORGANIC CARBON;

EID: 73849096176     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200925295     Document Type: Article

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