SCOPUS 정보 검색 플랫폼

Volumn 95, Issue 26, 2009, Pages

Spectroscopic evidence for limited carrier hopping interaction in amorphous ZnO thin film

(9) Cho, Deok Yong a Kim, Jeong Hwan b Na, Kwang Duk b Song, Jaewon b Hwang, Cheol Seong b Park, Byeong Gyu c Kim, Jae Young c Min, Chul Hee d Oh, Se Jung d

a Sungkyunkwan University (South Korea)

b Seoul National University (South Korea)

c Pohang University of Science and Technology (POSTECH) (South Korea)

d Seoul National University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS ZNO; CARRIER HOPPING; COMPARATIVE STUDIES; ELECTRICAL PROPERTY; ELECTRON HOPPING; SPECTROSCOPIC EVIDENCE; STRUCTURAL DISORDERS; VALENCE BAND PHOTOEMISSION SPECTROSCOPIES; WURTZITES; ZNO;

ABSORPTION SPECTROSCOPY; AMORPHOUS FILMS; ELECTRIC PROPERTIES; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; GRAIN BOUNDARIES; METALLIC FILMS; ZINC; ZINC SULFIDE;

ZINC OXIDE;

EID: 73649112403 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3275738 Document Type: Article

Times cited : (38)

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