Dielectric properties and reliability of Zn0.95Mg 0.05TiO3+0.25TiO2 MLCCs with different Pd/Ag ratios of electrodes

International Journal of Applied Ceramic Technology

Volumn 7, Issue 1, 2010, Pages 71-80

  Lee, Ying Chieh ^a  

^a NATIONAL PINGTUNG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AG DIFFUSION; BREAKDOWN VOLTAGE; CO-FIRING; DIELECTRIC CONSTANTS; DIELECTRIC LAYER; ELECTRICAL RESISTANCES; INNER-ELECTRODES; INSULATION RESISTANCE; MEASURING TEMPERATURE; MICRO MECHANISMS; MULTILAYER CERAMIC CAPACITORS; SILVER MIGRATION; SINTERING TEMPERATURES; TIO; ZNO;

ACTIVATION ENERGY; CAPACITORS; CERAMIC CAPACITORS; DIELECTRIC PROPERTIES; ELECTRODES; ELECTROLYTIC CAPACITORS; GRAIN BOUNDARIES; OXYGEN; OXYGEN VACANCIES; PALLADIUM; RELIABILITY; SINTERING; ZINC; ZINC OXIDE;

SILVER;

EID: 73649091122     PISSN: 1546542X     EISSN: 17447402     Source Type: Journal    
DOI: 10.1111/j.1744-7402.2008.02327.x     Document Type: Article

References (22)

1. 2-Based Ceramic Capacitors Mater. Lett., 57 4351 4355 (2003).
2. J. L. Paulsen E. K. Reed Highly Accelerated Lifetesting of Base-Metal-Electrode Ceramic Chip Capacitors Microelectron. Reliab., 42 815 820 (2002).
3. A. C. Caballero, E. Nieto, P. Duran, C. Moure, M. Kosec, Z. Samardzija G. Drazic Ceramic-Electrode Interaction in PZT and PNN-PZT Multilayer Piezoelectric Ceramics with Ag/Pd 70/30 Inner Electrode J. Mater. Sci., 32 3257 3262 (1997).
4. R. Z. Zuo, L. T. Li Z. L. Gui Influence of Silver Migration on Dielectric Properties and Reliability of Relaxor Based MLCCs Ceram. Int., 26 673 676 (2000).
5. R. Z. Zuo, L. T. Li, N. X. Zhang Z. L. Gui Interfacial Reaction of Ag/Pd Metals with Pb-Based Relaxor Ferroelectrics Including Additives Ceram. Int., 27 85 89 (2001).
6. C. H. Lu J. Y. Lin Interaction Between Lead Iron Niobate/Tungstate Ceramics and Silver/Palladium Metals Ceram. Int., 23 223 228 (1997).
7. 2 J. Am. Ceram. Soc., 43 125 131 (1960).
8. 3 Microwave Dielectrics J. Am. Ceram. Soc., 82 3476 3480 (1999).
9. H. T. Kim, S. H. Kim, S. Nahm J. D. Byun Low-Temperature Sintering and Microwave Dielectric Properties of Zinc Metatitanate-Rutile Mixtures Using Boron J. Am. Ceram. Soc., 82 3043 3048 (1999).
10. H. T. Kim, J. D. Byun Y. H. Kim Microstructure and Microwave Dielectric Properties of Modified Zinc Titanates (I) Mater. Res. Bull., 33 [6] 963 973 (1998).
11. 3 Addition Jpn. J. Appl. Phys., 43 [11A] 7596 7599 (2004).
12. K. Haga, T. Ishii, J. I. Mashiyama T. Ikeda Dielectric Properties of Two-Phase Mixture Ceramics Composed of Rutile and its Compounds Jpn. J. Appl. Phys., 31 3156 3159 (1992).
13. N. Halder, A. Das Sharma, S. K. Khan, A. Sn H. S. Maiti Effect of Silver Addition on the Dielectric Properties of Barium Titanate Based Low Temperature Processed Capacitors Mater. Res. Bull., 34 [4] 545 550 (1999).
14. R. Z. Zuo, L. T. Li, Z. L. Gui, T. F. Hung Z. K. Xu TEM and EDS Investigation of Heterogeneous Interfaces in Cofired Multilayer Ceramic Capacitors Mater. Sci. Eng., B95 1 5 (2002).
15. T. Nakamura, Y. Okano S. Miura Interfacial Diffusion Between Ni-Zn-Cu Ferrite and Ag During Sintering J. Mater. Sci., 33 [4] 1091 1094 (1998).
16. A. C. Caballero E. Nieto Ceramic-Electrode Interaction in PZT and PNN-PZT Multilayer Piezoelectric Ceramics with Ag/Pd 70/30 Inner Electrode J. Mater. Sci., 32 3257 3262 (1997).
17. M. S. H. Chu C. E. Hodgkins, Multilayer Ceramic Devices (Advances in Ceramics), Vol. 19. eds., J. B. Blum C. W. Roger. American Ceramics Society, Westerville, OH, 1986, p. 203.
18. G. Alrt, D. Hennings G. De With, J. Appl. Phys., 58 [4] 1619 1625 (1985).
19. 19 (M=Ba, Sr and Ca; X=Mg and Zn) Ceramics Mater. Lett., 57 2545 2552 (2003).
20. D. N. Donahoe, M. Pecht, I. K. Lloyd S. Ganesan, Moisture Induced Degradation of Multilayer Ceramic Capacitors, Microelectronics Reliability, 46 400 408 (2006).
21. 3 J. Am. Ceram. Soc., 87 401 407 (2004).
22. 3-Based Multilayer Ceramic Capacitor Jpn. J. Appl. Phys, 45 [7] 5859 5864 (2006).