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Volumn 62, Issue 6, 2010, Pages 399-402
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Focused ion beam/scanning electron microscopy tomography and conventional transmission electron microscopy assessment of Ni4Ti3 morphology in compression-aged Ni-rich Ni-Ti single crystals
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Author keywords
Ni Ti; Ni4Ti3; Precipitates; Shape memory alloys; TEM
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Indexed keywords
AVERAGE DISTANCE;
COMPRESSION DIRECTIONS;
CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPIES;
DUAL-BEAM SYSTEM;
FIB/SEM;
NITI ALLOYS;
PARTICLE SHAPE;
SHAPE MEMORY ALLOY;
TEM;
THREE-DIMENSIONAL RECONSTRUCTION;
ALLOYS;
ELECTRONS;
IMAGE ANALYSIS;
MORPHOLOGY;
SHAPE MEMORY EFFECT;
SINGLE CRYSTALS;
THREE DIMENSIONAL;
TOMOGRAPHY;
TRANSMISSION ELECTRON MICROSCOPY;
TITANIUM ALLOYS;
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EID: 73549102700
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2009.11.040 Document Type: Article |
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Times cited : (21)
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References (15)
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