Sub-wavelength plasmonic modes in a conductor-gap-dielectric system with a nanoscale gap

Optics Express

Volumn 18, Issue 1, 2010, Pages 348-363

  Avrutsky, Ivan ^a   Soref, Richard ^a   Buchwald, Walter ^b  

^a Wayne State University   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELDS; ELECTRIC LOSSES; GUIDED ELECTROMAGNETIC WAVE PROPAGATION;

ANALYTICAL ESTIMATIONS; CHIP-SCALE; CUT-OFF; DIELECTRIC CLADDING; DIELECTRIC SYSTEMS; DISPERSION EQUATIONS; FAR INFRARED; GAP THICKNESS; GUIDED MODES; HIGH-INDEX; LATERAL CONFINEMENT; LATERAL MODES; LAYER THICKNESS; MODAL FIELD; NANO SCALE; NUMERICAL SIMULATION; PLASMONIC WAVEGUIDES; PROPAGATION LOSS; SPATIAL VARIATIONS; SUB-WAVELENGTH; SUBWAVELENGTH THICKNESS; SURFACE-PLASMON;

PLASMONS;

NANOMATERIAL;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; NANOTECHNOLOGY; REFRACTOMETRY; SURFACE PLASMON RESONANCE; THEORETICAL MODEL;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; ELECTRIC CONDUCTIVITY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MODELS, THEORETICAL; NANOSTRUCTURES; NANOTECHNOLOGY; REFRACTOMETRY; SURFACE PLASMON RESONANCE;

EID: 73549084064     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.000348     Document Type: Article

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