Electrodeposition and stripping analysis of bismuth selenide thin films using combined electrochemical quartz crystal microgravimetry and stripping voltammetry

Journal of Electroanalytical Chemistry

Volumn 638, Issue 2, 2010, Pages 195-203

  Ham, Sunyoung ^a   Jeon, Soyeon ^b   Park, Minsoon ^b   Choi, Seungun ^b   Paeng, Ki Jung ^a   Myung, Noseung ^b   Rajeshwar, Krishnan ^c  

^a Yonsei University Wonju   (South Korea)

^b Konkuk University   (South Korea)

^c UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

Compositional assay; Cyclic voltammetry; Semiconductor; Thermoelectric material

Indexed keywords

ASSAYS; BIOELECTRIC PHENOMENA; BISMUTH; CORROSION; CRYSTAL IMPURITIES; CYCLIC VOLTAMMETRY; ELECTRODEPOSITION; ELECTROLYSIS; ELECTROLYTES; OXIDE MINERALS; QUARTZ; SODIUM; STOICHIOMETRY; STRIPPING (DYES); THERMOELECTRIC EQUIPMENT; THIN FILMS;

BISMUTH SELENIDE; CATHODIC SCAN; CATHODIC STRIPPING; COMPOSITIONAL ANALYSIS; COMPOSITIONAL ASSAY; DEPOSITION POTENTIAL; ELECTRODEPOSITED FILMS; ELECTRODEPOSITION POTENTIAL; ELECTROLYTE COMPOSITIONS; HYDROGEN EVOLUTION; MOLAR RATIO; QUARTZ CRYSTAL MICROGRAVIMETRY; REDUCTION PEAK; SEMICONDUCTOR; STRIPPING ANALYSIS; STRIPPING VOLTAMMETRY; THERMOELECTRIC MATERIAL;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 73049097742     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jelechem.2009.11.018     Document Type: Article

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