Compositional analysis of electrodeposited bismuth telluride thermoelectric thin films using combined electrochemical quartz crystal microgravimetry- stripping voltammetry

Analytical Chemistry

Volumn 80, Issue 17, 2008, Pages 6724-6730

  Ham, Sunyoung ^a   Jeon, Soyeon ^b   Lee, Ungki ^b   Park, Minsoon ^b   Paeng, Ki Jung ^a   Myung, Noseung ^b   Rajeshwar, Krishnan ^c  

^a Yonsei University Wonju   (South Korea)

^b Konkuk University   (South Korea)

^c UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OXIDE MINERALS; QUARTZ; THICK FILMS;

BISMUTH TELLURIDES; QUARTZ CRYSTAL MICROGRAVIMETRY; STRIPPING VOLTAMMETRY; THIN FILMS;

STRIPPING (DYES);

BISMUTH; BISMUTH TELLURIDE; SODIUM SULFATE; TELLURIUM; UNCLASSIFIED DRUG;

ANODIC STRIPPING POTENTIOMETRY; ARTICLE; CHEMICAL ANALYSIS; ELECTROCHEMICAL QUARTZ CRYSTAL MICROGRAVIMETRY; ELECTROCHEMISTRY; ELECTRODEPOSITION; FILM; FLOW MEASUREMENT; OXIDATION; SENSITIVITY ANALYSIS; STOICHIOMETRY; TECHNOLOGY;

EID: 51549116087     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac8008127     Document Type: Article

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