Experimental characterisation and modelling of high-voltage IGBT modules off-state thermal instability

2009 13th European Conference on Power Electronics and Applications, EPE '09

Volumn , Issue , 2009, Pages

  Castellazzi, Alberto ^a   Saiz, José ^b   Mermet Guyennet, Michel ^b  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b ALSTOM   (France)

Author keywords

IGBT; Modeling; Reliability; Thermal design; Traction application

Indexed keywords

3D NUMERICAL MODEL; ADVANCED MODELING TECHNIQUES; ANALYTICAL MODEL; CHARACTERISATION; EXPERIMENTAL CHARACTERIZATION; HIGH VOLTAGE DEVICES; HIGH-VOLTAGE IGBT; MULTI-CHIP; POWER-LOSSES; RAILWAY TRACTION; REVERSE BIAS VOLTAGE; RISK OF FAILURE; SEMICONDUCTOR PHYSICS; THERMAL DESIGNS; THERMAL INSTABILITIES; THERMAL RUNAWAYS; TRACTION APPLICATIONS;

ACTIVE FILTERS; DESIGN; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); PHOTOLITHOGRAPHY; POWER ELECTRONICS; THERMODYNAMIC STABILITY; TRACTION (FRICTION);

THREE DIMENSIONAL;

EID: 72949100054     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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