Field-induced ESR spectroscopy on rubrene single-crystal field-effect transistors

Materials Research Society Symposium Proceedings

Volumn 1154, Issue , 2009, Pages 85-89

  Matsui, Hiroyuki ^a,b   Hasegawa, Tatsuo ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SPIN RESONANCE SPECTROSCOPY; GRAIN BOUNDARIES; MAGNETIC MOMENTS; SINGLE CRYSTALS; SINGLE ELECTRON TRANSISTORS; THIN FILM TRANSISTORS;

ESR SPECTROSCOPY; FIELD INDUCED; FIELD-INDUCED CARRIERS; GATE VOLTAGES; MULTIPLE TRAPS; PENTACENE THIN FILM TRANSISTORS; PENTACENES; SINGLE CRYSTAL FIELD-EFFECT TRANSISTORS;

FIELD EFFECT TRANSISTORS;

EID: 72849116316     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-1154-b08-04     Document Type: Conference Paper

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