Influence of chromium concentration on the optical-electronic properties of ruby microstructures

Journal of Physics D: Applied Physics

Volumn 43, Issue 1, 2010, Pages

  Cossolino, L C ^a   Zanatta, A R ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ALN FILMS; ALUMINIUM NITRIDE; CHROMIUM CONCENTRATION; CONCENTRATION RANGES; CR CONCENTRATION; CR CONTENT; ENERGY DISPERSIVE X-RAY SPECTROMETRY; FILM DEPOSITION; MAIN CHARACTERISTICS; OPTICAL ELECTRONICS; OPTICAL TRANSMISSION MEASUREMENTS; RADIO FREQUENCY SPUTTERING; RECOMBINATION PROCESS; SPECTRAL CHARACTERISTICS; SPECTROSCOPIC CHARACTERIZATION; THERMAL TREATMENT; THERMAL-ANNEALING;

ALUMINUM COMPOUNDS; AMORPHOUS FILMS; CONCENTRATION (PROCESS); CORUNDUM; ELECTRONIC PROPERTIES; LIGHT TRANSMISSION; LUMINESCENCE; MICROSTRUCTURE; NITRIDES; OPTICAL PROPERTIES; OXYGEN; RUBY; SPECTROSCOPIC ANALYSIS;

CHROMIUM;

EID: 72649095217     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/43/1/015302     Document Type: Article

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