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Journal of Applied Physics

Volumn 90, Issue 1, 2001, Pages 248-251

Microoptical characterization of electroluminescent SrS:Cu,Ag thin films by photo- and cathodoluminescence observations

(4) Poelman, D a Wauters, D a Versluys, J a Van Meirhaeghe, R L a

a GHENT UNIVERSITY (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035397077 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1379350 Document Type: Article

Times cited : (8)

References (13)

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