EPMA-EDS surface measurements of interdiffusion coefficients between miscible metals in thin films

Applied Surface Science

Volumn 256, Issue 6, 2010, Pages 1855-1860

  Christien, F ^a   Pierson, J F ^b   Hassini, A ^a   Capon, F ^b   Le Gall, R ^a   Brousse, T ^a  

^a UNIVERSITÉ DE NANTES   (France)

^b INSTITUT JEAN LAMOUR   (France)

Author keywords

Modeling; Nickel; Palladium; PhiRoZ; Surface analysis; XPP model

Indexed keywords

BINARY ALLOYS; ENERGY DISPERSIVE SPECTROSCOPY; LUNAR SURFACE ANALYSIS; METAL ANALYSIS; MODELS; NICKEL; PALLADIUM; PALLADIUM ALLOYS; PROBES; SCANNING ELECTRON MICROSCOPY; SURFACE ANALYSIS; SURFACE MEASUREMENT; TEMPERATURE; THIN FILMS;

ANNEALING TEMPERATURES; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FICK'S DIFFUSION EQUATION; INTER-DIFFUSION COEFFICIENTS; NI THIN FILMS; PHIROZ; VERY LOW TEMPERATURES; XPP MODEL;

ELECTRON PROBE MICROANALYSIS;

EID: 72549112063     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.10.019     Document Type: Article

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