EPMA measurements of diffusion profiles at the submicrometre scale

Microchimica Acta

Volumn 139, Issue 1-4, 2002, Pages 3-10

  Arnould, Olivier ^a   Hild, François ^a  

^a SORBONNE UNIVERSITÉ   (France)

Author keywords

(Secondary) fluorescence; Average effect; Concentration profiles; EPMA; Interface

Indexed keywords

EID: 2942695625     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s006040200032     Document Type: Article

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