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Volumn 72, Issue 4, 2009, Pages 591-596

Dynamical simulations on the two-dimensional XY model with random-phase shift

Author keywords

[No Author keywords available]

Indexed keywords

ARRHENIUS; CREEP MOTION; CRITICAL EXPONENT; CRITICAL TEMPERATURES; DEPINNING TRANSITIONS; DISORDER STRENGTH; DYNAMIC SCALING; DYNAMICAL SIMULATION; KOSTERLITZ-THOULESS; LOW TEMPERATURE PHASIS; LOW TEMPERATURES; RANDOM PHASE SHIFT; RANDOM-PHASE; RESISTIVELY SHUNTED JUNCTIONS; STRONG DISORDERS; WEAK DISORDER; X-Y MODEL; ZERO TEMPERATURES;

EID: 72449201491     PISSN: 14346028     EISSN: 14346036     Source Type: Journal    
DOI: 10.1140/epjb/e2009-00385-x     Document Type: Article
Times cited : (3)

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