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Volumn 80, Issue 5, 2009, Pages
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XAS study of the orientation of oriented carbon nanotube films
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON ATOMS;
CHEMICAL VAPOUR DEPOSITION;
CNT FILMS;
GRAZING INCIDENCE;
GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING;
HOT FILAMENT;
LOCAL ENVIRONMENTS;
ORIENTED CARBON NANOTUBES;
SCANNING ELECTRON MICROSCOPES;
SI (100) SUBSTRATE;
SPECTRAL FEATURE;
TRANSMISSION ELECTRON MICROSCOPE;
ABSORPTION SPECTROSCOPY;
ALIGNMENT;
CARBON FILMS;
CARBON NANOTUBES;
ELECTRON MICROSCOPES;
SCANNING ELECTRON MICROSCOPY;
SILICON COMPOUNDS;
SUBSTRATES;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
X RAY SCATTERING;
CHEMICAL VAPOR DEPOSITION;
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EID: 72449178471
PISSN: 00318949
EISSN: 14024896
Source Type: Journal
DOI: 10.1088/0031-8949/80/05/055602 Document Type: Article |
Times cited : (8)
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References (17)
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